4 results match your criteria: "Swiss Federal Institute of Technology Lausanne EPFL-STI-NAM[Affiliation]"
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December 2012
Nanophotonics and Metrology Laboratory, Swiss Federal Institute of Technology Lausanne EPFL-STI-NAM, Station 11, CH-1015 Lausanne, Switzerland.
We study a compound plasmonic system composed of a periodic Au grating array placed close to a thin Au film. The study is not limited to normal incidence and dispersion diagrams are computed for a broad variety of parameters. In addition to identifying localized and propagating modes and the coupling/hybridization interactions between them, we go further and identify modes of compound nature, i.
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June 2011
Nanophotonics and Metrology Laboratory, Swiss Federal Institute of Technology Lausanne EPFL-STI-NAM, Lausanne, Switzerland.
The transition from localized to delocalized plasmons (i.e. the transition from a situation where the decay length of a travelling surface plasma wave is greater than its propagation distance to a situation where it is smaller) and hence the onset of plasmon delocalization is studied in a single 2D silver nanoparticle of increasing length.
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January 2011
Nanophotonics and Metrology Laboratory, Swiss Federal Institute of Technology Lausanne EPFL-STI-NAM, Lausanne, Switzerland.
Remote sensing finds more and more applications, from industrial control, to face recognition, not forgetting terrain surveying. This trend is well exemplified by fringe projection techniques, which enjoyed a considerable development in the recent years. In addition of high requirement in terms of measurement accuracy and spatial resolution, the end-users of full-field techniques show a growing interest for dynamic regimes.
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January 2009
Nanophotonics and Metrology Laboratory, Swiss Federal Institute of Technology Lausanne EPFL-STI-NAM, Station 11, CH-1015 Lausanne, Switzerland.
In a wider and wider range of research and engineering activities, there is a growing interest for full-field techniques, featuring nanometric sensitivities, and able to be addressed to dynamic behaviors characterization. Speckle interferometry (SI) techniques are acknowledged as good candidates to tackle this challenge. To get rid of the intrinsic correlation length limitation and simplify the un-wrapping step, a straightforward approach lies in the pixel history analysis.
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