2 results match your criteria: "SP Technical Research Institute of Sweden - Chemistry[Affiliation]"
J Colloid Interface Sci
June 2015
SP Technical Research Institute of Sweden - Chemistry, Materials and Surfaces, Box 5607, SE-114 86 Stockholm, Sweden; KTH Royal Institute of Technology, Department of Chemistry, Surface and Corrosion Science, SE-100 44 Stockholm, Sweden. Electronic address:
We show by using AFM colloidal probe microscopy (combinations of hydrophobic/superhydrophobic as probe/surface) that superhydrophobicity displays a set of specific events when compared with hydrophobicity. Both attraction (due to capillary and wetting forces) and repulsion (most likely due to repelling air/vapor layers or micro-/nanobubbles) occur upon approach and when surfaces are pulled apart both shorter range (50-100 nm or more) and longer range (several micrometers) attractive forces are displayed. The interaction is explained by forces generated through the formation of air and water vapor cavities, in the shorter-range (>50 nm) case maintaining a constant volume of the cavity, in agreement with calculation of capillary forces, and in the longer-range (>1 μm) case through access of air to the cavity, in agreement with thermodynamics of cavity growth.
View Article and Find Full Text PDFPhys Chem Chem Phys
November 2013
SP Technical Research Institute of Sweden - Chemistry, Materials and Surfaces, Box 5607, SE-114 86 Stockholm, Sweden.
Friction forces have long been associated with the famous Amontons' rule that states that the friction force is linearly dependent on the applied normal load, with the proportionality constant being known as the friction coefficient. Amontons' rule is however purely phenomenological and does not in itself provide any information on why the friction coefficient is different for different material combinations. In this study, friction forces between a colloidal probe and nanostructured particle coated surfaces in an aqueous environment exhibiting different roughness length scales were measured by utilizing the atomic force microscope (AFM).
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