1 results match your criteria: "National Institute of Standards and Technology-Semiconductor Electronics Division[Affiliation]"
Separation and metrology of nanoparticles by nanofluidic size exclusion.
Lab Chip
October 2010
National Institute of Standards and Technology-Semiconductor Electronics Division, 100 Bureau Drive, Stop 8120, Gaithersburg, Maryland 20899-8120, USA.
Article Synopsis
- A new nanofluidic technology was developed for separating and measuring nanoparticles on a chip through an engineered channel with a unique staircase-like depth profile.
- The method utilized multiple stepped reductions in channel depth to achieve size exclusion of a mixed population of nanoparticles.
- Epifluorescence microscopy played a key role in visualizing the size exclusion, allowing for the measurement of nanoparticle size distributions and confirming the effectiveness of the separation process.