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Article Synopsis
- Focusing X-rays to nanometer sizes is limited by the challenges in creating high-quality optics and nanostructures.
- Multilayer zone plates are developed to overcome these issues by allowing a wide range of aspect ratios and achieving high resolutions.
- A novel fabrication method using atomic layer deposition and focused ion beam slicing results in zone plates that demonstrate impressive resolution performance, paving the way for advancements in high-energy X-ray microscopy.