4 results match your criteria: "Joint Laboratory of Optical Communications of Zhejiang University[Affiliation]"

Analysis of the loss resulting from point defects for an etched diffraction grating demultiplexer by using the method of moments.

J Opt Soc Am A Opt Image Sci Vis

August 2005

Center for Optical and Electromagnetic Research, State Key Laboratory of Modern Optical Instrumentation, Joint Laboratory of Optical Communications of Zhejiang University, Zhejiang University, Yu-Quan, Hangzhou, 310027, China.

An effective method for analyzing the effect of point defects (e.g., dust grains and air bubbles) on an etched diffraction grating demultiplexer is presented by using the method of moments.

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Y-branch spot-size converter for a buried silica waveguide with large index difference.

Appl Opt

June 2004

Centre for Optical and Electromagnetic Research, State Key Laboratory of Modern Optical Instrumentation, Joint Laboratory of Optical Communications of Zhejiang University, Yu-Quan, 310027 Hangzhou, China.

Coupling loss occurs between a standard single-mode fiber and a silica waveguide when the difference between the refractive indices of the core and the cladding of the silica waveguide is high. We designed a Y-branch structure for use as a spot-size converter to reduce this coupling loss. The structure was tested with a three-dimensional beam-propagation method and was shown to exhibit a significantly reduced coupling loss, a low polarization-dependent loss, and a good tolerance of imprecision in fabrication.

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Analysis of the birefringence of a silicon-on-insulator rib waveguide.

Appl Opt

February 2004

Center for Optical and Electromagnetic Research, Joint Laboratory of Optical Communications of Zhejiang University, State Key Laboratory for Modern Optical Instrumentation, Zhejiang University, Yu-Quan, Hangzhou 310027, China.

A detailed analysis of the polarization characteristics (birefringence) of a silicon-on-insulator (SOI) rib waveguide is given. The fundamental TE- and TM-polarized modes of the SOI rib waveguide are calculated by a semivectorial finite-difference method. The rib width and the slab height of the SOI rib waveguide are normalized with respect to the total height of the silicon layer.

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Analysis of characteristics of bent rib waveguides.

J Opt Soc Am A Opt Image Sci Vis

January 2004

Centre for Optical and Electromagnetic Research, Joint Laboratory of Optical Communications of Zhejiang University, Yu-Quan, Hangzhou 310027, China.

With a perfectly matched layer boundary treatment, a semivectorial finite-difference method is used to calculate the eigenmodes of a single-mode (SM) or multimode (MM) bent rib waveguide. A detailed analysis is given for the dependence of the bending losses (including the pure bending loss and the transition loss) on geometrical parameters of the bent rib waveguide such as the rib width, the rib height, and the bending radius. The characteristics of the higher-order modes are analyzed.

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