3 results match your criteria: "John F. Welch Technology Center[Affiliation]"

This paper presents a method for automatically estimating the quality of Parasternal Long AXis (PLAX) B-mode echocardiograms. The purpose of the algorithm is to provide live feedback to the user on the quality of the acquired image. The proposed approach uses Generalized Hough Transform to compare the structures derived from the incoming image to a representative atlas, thereby providing a quality metric (PQM).

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Automated robust segmentation of intra-ventricular septum (IVS) from B-mode echocardiographic images is an enabler for early quantification of cardiac disease. Segmentation of septum from ultrasound images is very challenging due to variations in intensity/contrast in and around the septum, speckle noise and non-rigid shape variations of the septum boundary. In this work, we effectively address these challenges using an approach that merges novel computer vision ideas with physiological markers present in cardiac scans.

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Nanoscale friction and wear maps.

Philos Trans A Math Phys Eng Sci

April 2008

GE Global Research, John F. Welch Technology Center, Plot no. 122, EPIP Phase 2, Hoodi Village, Whitefield Road, Bangalore 560 066, India.

Friction and wear are part and parcel of all walks of life, and for interfaces that are in close or near contact, tribology and mechanics are supremely important. They can critically influence the efficient functioning of devices and components. Nanoscale friction force follows a complex nonlinear dependence on multiple, often interdependent, interfacial and material properties.

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