Unlocking the effect of film thickness on the thermoelectric properties of thermally evaporated Cu Se thin films.

Miniaturization is crucial to realize thermoelectric (TE) devices as an energy source for smart utilities. The present work reports the bulk-like value realized in Cu Se thin films in the mid-temperature range. The effect of varying the film thickness on the structural and TE properties were systematically studied, and the obtained results were compared with that of their bulk counterpart.