This study investigates how residual carbon on p-GaN photocathodes affects their quantum efficiency, emphasizing the importance of a clean surface for achieving negative electron affinity.
The research utilizes an in-situ X-ray photoelectron spectrometer (XPS) to monitor changes on the photocathode surface during cleaning, activation, and degradation processes.
Despite the presence of carbon and oxygen contaminants from the manufacturing process, activating p-GaN with cesium allows for the formation of negative electron affinity and reveals the role of cesium carbide in photocathode performance degradation.