1 results match your criteria: "Department Process Integrated Inspection Systems Fraunhofer Institute for Integrated Circuits IIS[Affiliation]"
Inspection of complex surfaces by means of structured light patterns.
Opt Express
March 2010
Department Process Integrated Inspection Systems Fraunhofer Institute for Integrated Circuits IIS, D-91058 Erlangen, Germany.
Article Synopsis
- The paper expands a surface inspection method originally designed for industrial use, targeting specular cylindrical surfaces, to include free-form rough and specular shapes by analyzing stripe patterns from structured light projections.
- A four-step procedure is proposed to enhance image interpretation, which involves comparing feature-based descriptions, determining optimal sub-groups, fusing them, and selecting the best features.
- Results indicate a classification rate improvement of over 2% using a refined set of features, achieving similar high rates with only a quarter of the original features for categorizing free-form surfaces.