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Determination of trace concentrations of elements in high purity tellurium by radio frequency glow discharge optical emission spectrometer (RF-GDOES).
Ann Chim
October 2007
Analytical Chemistry Division, Center for Materials for Electronics Technology (CMET), IDA, Phase-III, HCL Post, Cherlapalli, Hyderabad - 500 051, India.
A method was established for the determination of trace impurities in high purity tellurium (Te) 99.9999 (6N) by radio frequency glow discharge optical emission spectrometry (RF-GDOES). The optimized parameters are power, argon pressure, pre-integration time, analysis time and selection of wavelength.
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