3 results match your criteria: "Center for Applied Research in Electronics (CARE)[Affiliation]"
Nanoscale Res Lett
October 2021
International College of Semiconductor Technology, National Chiao Tung University, Hsinchu, 1001, Taiwan.
The presence of surface traps is an important phenomenon in AlGaN/GaN HEMT. The electrical and physical properties of these surface traps have been analyzed through the study of 2DEG electron concentration along with the variation of aluminum percentage in the barrier layer of HEMT. This analysis shows that from deep to shallow donors, the percentage change in electron density in 2DEG gets saturated (near 8%) with change in aluminum concentration.
View Article and Find Full Text PDFNanotechnology
September 2020
Center for Applied Research in Electronics (CARE), Indian Institute of Technology Delhi, New Delhi, India.
The present study investigates the piezoresistive properties of polycrystalline MoS film for strain-sensing applications. The gauge factor (GF) of the flexible MoS device (MoS/PET) has been calculated to be 102 ± 5 in the stress range from ~7 MPa to ~14 MPa. In addition, to improve the sensing stress range, the flexible strain sensors are encapsulated by SU-8.
View Article and Find Full Text PDFJ Nanosci Nanotechnol
October 2012
Center for Applied Research in Electronics (CARE), New Delhi 110016, India.
We report on controlling the morphology of tin oxide (SnO2) nanostructures and the study of the effect of surface morphology on structural and optical properties of SnO2 nanostuctures. In present work, Tin oxide (SnO2) nanostructures such as nanowires and nanorods have been grown by thermal evaporation of SnO2 powder. To demonstrate the effect of different substrates on the morphology of grown SnO2 nanostructures, the thermal evaporation of SnO2 powder was carried out on Si and gold catalyzed Si (Au/Si) substrates.
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