Combining spectroscopic techniques with spatially-resolved microscopy capabilities creates an avenue for in-depth investigations into understanding the impact of specific regions and features across surfaces and their relevance for resulting device performance. For device optimization and development, these techniques can be utilized as a means to identify the impacts and roles of the underlying defects and charge extraction across interfaces. Here, we highlight the ways that (correlated) spectro-microscopy methods have been utilized within the field of materials science to understand materials properties and the underlying optoelectronic processes dictating device functionality. We also give a perspective on the importance of correlated morphological and spectro-microscopy methods for future device improvement.
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Combining spectroscopic techniques with spatially-resolved microscopy capabilities creates an avenue for in-depth investigations into understanding the impact of specific regions and features across surfaces and their relevance for resulting device performance. For device optimization and development, these techniques can be utilized as a means to identify the impacts and roles of the underlying defects and charge extraction across interfaces. Here, we highlight the ways that (correlated) spectro-microscopy methods have been utilized within the field of materials science to understand materials properties and the underlying optoelectronic processes dictating device functionality.
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