Severity: Warning
Message: file_get_contents(https://...@gmail.com&api_key=61f08fa0b96a73de8c900d749fcb997acc09&a=1): Failed to open stream: HTTP request failed! HTTP/1.1 429 Too Many Requests
Filename: helpers/my_audit_helper.php
Line Number: 197
Backtrace:
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 197
Function: file_get_contents
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 271
Function: simplexml_load_file_from_url
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 1057
Function: getPubMedXML
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 3175
Function: GetPubMedArticleOutput_2016
File: /var/www/html/application/controllers/Detail.php
Line: 575
Function: pubMedSearch_Global
File: /var/www/html/application/controllers/Detail.php
Line: 489
Function: pubMedGetRelatedKeyword
File: /var/www/html/index.php
Line: 316
Function: require_once
High-entropy doping has been demonstrated to be an effective method for enhancing the electrochemical performance of NASICON cathode materials, yet the underlying mechanisms remain unclear. In this study, we employ V-based sodium superionic conductor (NASICON) cathode materials as a model system to investigate the impact of various substituting elements (Al, Cr, Fe, Ga, and In) on the local structure of the material. This strategy is proven to effectively suppress V-ion migration and, as a consequence, enhance the reversibility of multielectron reactions. By combining electrochemical analysis and spectroscopic techniques (in situ XRD, STEM, and XAFS), we investigated the changes in the composition, structural evolution, and distortion of the VO octahedral before and after cycling. Under a 1 C rate, the capacity retention after 500 cycles is increased from 52.3% to 85.7%, with significant suppression of voltage hysteresis and capacity fading. This work elucidates the mechanism of improved multielectron reaction reversibility and provides guidance for the design of high-performance polyanion electrodes.
Download full-text PDF |
Source |
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http://dx.doi.org/10.1021/acsami.4c21356 | DOI Listing |
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