Congruent lithium niobate is a type of lithium niobate crystal with a mature growth process and is widely used in nonlinear optics research. Its refractive index accuracy will play a crucial role in the research and application of nonlinear optics. In this paper, we theoretically analyze the accuracy and reliability of nonlinear methods and experimentally measure the refractive index of ordinary light at different wavelengths and temperatures in a non-critical phase matching LN crystal by the sum-frequency generation and spontaneous parametric down-conversion processes, with the help of the existing accurate Sellmeier equation for the refractive index of extraordinary light. By fitting the refractive index of ordinary light, a new set of parameters for the Sellmeier equation is established. This equation shows excellent agreement with existing experimental results, and greatly extends the range of wavelengths and temperatures to 0.5-10 and 20-250 .
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Congruent lithium niobate is a type of lithium niobate crystal with a mature growth process and is widely used in nonlinear optics research. Its refractive index accuracy will play a crucial role in the research and application of nonlinear optics. In this paper, we theoretically analyze the accuracy and reliability of nonlinear methods and experimentally measure the refractive index of ordinary light at different wavelengths and temperatures in a non-critical phase matching LN crystal by the sum-frequency generation and spontaneous parametric down-conversion processes, with the help of the existing accurate Sellmeier equation for the refractive index of extraordinary light.
View Article and Find Full Text PDFSimultaneous Measurement of Group Refractive Index Dispersion and Thickness of Fused Silica Using a Scanning White Light Interferometer.
Sensors (Basel)
December 2023
Department of Computer Science and Electrical Engineering, Handong Global University, Pohang 37554, Republic of Korea.
In this study, we simultaneously measured the group refractive index dispersion and thickness of fused silica using a scanning white light interferometer on a spectral range from 800 to 1050 nm. A delay error correction was performed using a He-Ne laser. The accuracy of the measured group refractive index dispersion of fused silica, when compared to the temperature-dependent Sellmeier equation, is within 4 × 10.
View Article and Find Full Text PDFChromatic dispersion and thermal coefficients of hygroscopic liquids: 5 glycols and glycerol.
Sci Data
December 2023
Institute of Physics, Polish Academy of Sciences, al. Lotników 32/46, 02-668, Warsaw, Poland.
Chromatic dispersion and thermal coefficients of 6 hygroscopic liquids: ethylene glycol, diethylene glycol, triethylene glycol, tetraethylene glycol, propylene glycol (propane-1, 2-diol), and glycerol were measured in the range from 390 to 1070 nm for temperatures from 1 to 45 °C. A modified Abbe refractometer was utilised. Special care was taken to avoid contaminating the liquids under the test with water and solid particles.
View Article and Find Full Text PDFSince the reported Sellmeier equation of water is fitted with sparse sampling points in the near-infrared region, the simulated refractive index sensitivity of dispersion enhanced interferometers deviates from the true value. Here, we measure the refractive index of aqueous sample based on hyperspectra, and research the effect of dispersion on ultra-sensitive interferometer. A piece of quartz plate is used to generate hyperspectra in the near-infrared region by building a wavefront splitting fiber Mach-Zehnder interferometer (WFSF-MZIs).
View Article and Find Full Text PDFMathematical models for fitting the refractive index versus the wavelength, such as the Cauchy, Sellmeier, and Drude equations, or physical models, such as the Lorentz model, are commonly used to fit the index properties of measured spectra of optical thin film witness samples for use in the design and production of optical interference coatings. The degree of agreement of the coating reflectance and transmittance with the design when the coatings are produced with these data will depend on the accuracy of the spectral measurements and index fittings. As thin-film coating technology has progressed, many cases are now encountered where no simple model is adequate to fit the actual index dispersion.
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