Establishing best practices for insect resistance management: a new paradigm for genetically engineered toxins in cotton expressing Mpp51Aa2.

J Econ Entomol

Department of Entomology and Plant Pathology and the North Carolina Plant Sciences Institute, NC State University, Raleigh, NC, USA.

Published: January 2025

Debate over resistance management tactics for genetically engineered (GE) crops expressing insecticidal toxins is not new. For several decades, researchers, regulators, and agricultural industry scientists have developed strategies to limit the evolution of resistance in populations of lepidopteran and coleopteran pests. A key attribute of many of these events was insecticide resistance management (IRM) strategies designed around a presumed high-dose expression sufficient to kill 99.5% of exposed larvae for some of the main target pests in corn, Zea mays L. and cotton, Gossypium hirsutum L. In contrast, other target pests did not meet this high-dose criterion. Similarly, the recent release of ThryvOn cotton that expresses thysanopteran and hemipteran active Mpp51Aa2.834_16 toxin is not high dose, working on a combination of behavioral and sublethal effects to suppress populations. This unique mode of control has generated considerable uncertainty about what IRM strategies will be most effective to limit field-evolved resistance to this unique spectrum of pests. The goal of this manuscript is to present several knowledge gaps that exist in proposed Mpp51Aa2 IRM plans, focusing on its activity on thrips, Frankliniella spp. Addressing these gaps will be crucial to limit resistance and preserve the benefits that this technology may provide by alleviating reliance on conventional insecticides and seed treatments. Broadly, these considerations will be important for future GE events that are non-high dose but remain valuable components of a more holistic insect management programs that integrate multiple tactics to reduce conventional insecticide use for challenging pests.

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Source
http://dx.doi.org/10.1093/jee/toae312DOI Listing

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