Scanning micromirrors represent a crucial component in micro-opto-electro-mechanical systems (MOEMS), with a broad range of applications across diverse fields. However, in practical applications, several factors inherent to the fabrication process and the surrounding usage environment exert a considerable influence on the accuracy of measurements obtained with the micromirror. Therefore, it is essential to calibrate the scanning micromirror and its measurement system. This paper presents a novel scanning micromirror calibration method based on the prediction of a particle swarm optimization-least squares support vector machine (PSO-LSSVM). The objective is to establish a correspondence between the actual deflection angle of the micromirror and the output of the measurement system employing a regression algorithm, thereby enabling the prediction of the tilt angle of the micromirror. The decision factor (R2) for this model at the -axis reaches a value of 0.9947.
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http://www.ncbi.nlm.nih.gov/pmc/articles/PMC11679894 | PMC |
http://dx.doi.org/10.3390/mi15121413 | DOI Listing |
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