AI Article Synopsis
- The study introduces a low-cost automated test station, called "ATLAS-MAP," designed for measuring electronic transport in field-effect transistors.
- The system uses open-source PyMeasure libraries for instrument control and can perform various testing methods like transfer curve and van der Pauw with adjustable gate voltages.
- Zinc oxide transistors of different thicknesses and channel sizes were tested to validate the setup, with an emphasis on standardized testing procedures for effective data analysis.
Article Abstract
The diversification of electronic materials in devices provides a strong incentive for methods to rapidly correlate device performance with fabrication decisions. In this work, we present a low-cost automated test station for gated electronic transport measurements of field-effect transistors. Utilizing open-source PyMeasure libraries for transparent instrument control, the "ATLAS-MAP" system serves as a customizable interface between sourcemeters and samples under test and is programmed to conduct transfer curve and van der Pauw methods with static and sweeping gate voltages. Zinc oxide transistors of variable thickness (5, 10, and 20 nm) and channel size (50 μm to 3 mm, of equal length and width) were fabricated to validate the design. Standardization of testing procedures and raw data formatting enabled automated data analysis. A detailed list of parts and code files for the system are provided.
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|---|---|
| http://www.ncbi.nlm.nih.gov/pmc/articles/PMC11659988 | PMC |
| http://dx.doi.org/10.1021/acsmeasuresciau.4c00034 | DOI Listing |
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