Severity: Warning
Message: file_get_contents(https://...@pubfacts.com&api_key=b8daa3ad693db53b1410957c26c9a51b4908&a=1): Failed to open stream: HTTP request failed! HTTP/1.1 429 Too Many Requests
Filename: helpers/my_audit_helper.php
Line Number: 176
Backtrace:
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 176
Function: file_get_contents
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 250
Function: simplexml_load_file_from_url
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 1034
Function: getPubMedXML
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 3152
Function: GetPubMedArticleOutput_2016
File: /var/www/html/application/controllers/Detail.php
Line: 575
Function: pubMedSearch_Global
File: /var/www/html/application/controllers/Detail.php
Line: 489
Function: pubMedGetRelatedKeyword
File: /var/www/html/index.php
Line: 316
Function: require_once
We propose a new bootloader design with dynamic boot addressing to increase the endurance of microcontroller flash memories and to use flash memory efficiently. Although the final industrial products are not updated much, regular programming during the development and testing phase inefficiently reduces the endurance of flash memory. Especially after the pandemic, the problems experienced in the production/supply processes of products using semiconductor technology and the highly extended deadlines have inspired our work to extend the life of the products used in the development and testing phase. Within the scope of the study, a bootloader design and implementation related to increasing the durability of flash memory, which affects the lifetime of microcontrollers, are explained. When a new application installation request comes, it is aimed to provide the following without the need for any additional hardware; It is to ensure that the data to be written to the flash memory is shared homogeneously between sectors, to prevent unnecessary memory deletion, to shorten the time spent on installing applications, to increase memory endurance and to predict possible memory endurance problems.
Download full-text PDF |
Source |
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http://www.ncbi.nlm.nih.gov/pmc/articles/PMC11636793 | PMC |
http://dx.doi.org/10.1016/j.heliyon.2024.e26760 | DOI Listing |
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