AI Article Synopsis
- Experimental near-field analysis of output beams from micro/nano-waveguides is crucial for designing nanophotonic devices, yet it hasn’t been demonstrated until now.
- The study introduces a plasmonic-nanowire beam analyzer using a single Au nanowire to scan near-field distributions, achieving a resolution of 190 nm and a collection efficiency of about 47.4%.
- This novel approach enables the first 3D characterization of spatial distributions from a metal nanowire output beam and showcases the ability to analyze complex multimodes in large nanoribbons, indicating potential applications in nanolasers and biosensing.
Article Abstract
Experimental near-field analysis of the output beams from the end faces of micro/nano-waveguide is very necessary, because important information such as spatial intensity distributions, mode orders, and divergence angles can be obtained, and are very important for investigating and designing nanophotonic devices. However, as far as we know, it has not been demonstrated yet. In this work, we experimentally demonstrate a plasmonic-nanowire near-field beam analyzer, utilizing a single Au nanowire (AuNW) as the probe to scan the spatial near-field distributions of emitted beams from micro/nano-waveguide end-faces. Our analyzer can resolve the trade-off between high measurement resolution and light collection efficiency in conventional beam analyzers by a reverse nanofocusing process, achieving a probe resolution of 190 nm (
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Source |
|---|---|
| http://www.ncbi.nlm.nih.gov/pmc/articles/PMC11501462 | PMC |
| http://dx.doi.org/10.1515/nanoph-2023-0937 | DOI Listing |
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