Carrier selective contacts with passivation effects are considered to have a significant influence on the performance of crystalline silicon (c-Si) solar cells. It is essential for electron selective contact materials to meet the requirements of ultra-low contact resistance and excellent passivation effects. This work introduces a stack layer of Lithium Phosphate (LiPO) /Titanium Dioxide (TiO) as a new electron selective passivating contact. It is found that the stack achieves an impressive contact resistivity (ρ) of 0.128 mΩ cm on n-type c-Si substrates with resistivity ranging from 1 to 3 Ω cm (14.6 mΩ cm for the n-Si/a-Si:H/LiPO/TiO/Al contact). Furthermore, it effectively reduces the surface recombination parameter (J) to less than 4 fA by incorporating a 6 nm a-Si:H(i) layer. The characterization of the n-Si/LiPO/TiO interface reveals that phosphorus diffusion into silicon plays a crucial role in achieving the ultra-low contact resistivity, while the presence of PO groups helps in fixing hydrogen atoms to maintain the desired chemical passivation effect. Finally, a silicon heterojunction solar cell (SHJ) with a rear full-area configuration of a-Si:H/LiPO/TiO/Al is successfully demonstrated achieving an impressive power conversion efficiency of 22.89%. The result proves the efficacy of employing hydrogen-rich low-work function metal oxide stacks as electron selective passivating contacts.
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http://dx.doi.org/10.1002/smll.202407398 | DOI Listing |
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