AI Article Synopsis
- * A new direct detection method created with KAImaging enhances DFXM capabilities in the high-energy X-ray range, reaching near-nanoscale resolution.
- * This new detection technique significantly reduces exposure times compared to traditional scintillator-based methods, facilitating the imaging of materials with weak diffraction signals.
Article Abstract
Recent developments in X-ray science provide methods to probe deeply embedded mesoscale grain structures and spatially resolve them using dark field X-ray microscopy (DFXM). Extending this technique to investigate weak diffraction signals such as magnetic systems, quantum materials and thin films prove challenging due to available detection methods and incident X-ray flux at the sample. We present a direct detection method developed in conjunction with KAImaging which focuses on DFXM studies in the hard X-ray range of 10s of keV and above capable of approaching nanoscale resolution. Additionally, we compare this direct detection scheme with routinely used scintillator-based optical detection and achieve an order of magnitude improvement in exposure times allowing for imaging of weakly diffracting ordered systems.
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| http://dx.doi.org/10.1364/OE.518974 | DOI Listing |
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