Severity: Warning
Message: file_get_contents(https://...@pubfacts.com&api_key=b8daa3ad693db53b1410957c26c9a51b4908&a=1): Failed to open stream: HTTP request failed! HTTP/1.1 429 Too Many Requests
Filename: helpers/my_audit_helper.php
Line Number: 176
Backtrace:
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 176
Function: file_get_contents
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 250
Function: simplexml_load_file_from_url
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 3122
Function: getPubMedXML
File: /var/www/html/application/controllers/Detail.php
Line: 575
Function: pubMedSearch_Global
File: /var/www/html/application/controllers/Detail.php
Line: 489
Function: pubMedGetRelatedKeyword
File: /var/www/html/index.php
Line: 316
Function: require_once
Cryo-electron microscopy (cryo-EM) is one of the most powerful experimental methods for macromolecular structure determination. However, accurate DNA/RNA structure modeling from cryo-EM maps is still challenging especially for protein-DNA/RNA or multi-chain DNA/RNA complexes. Here we propose a deep learning-based method for accurate de novo structure determination of DNA/RNA from cryo-EM maps at <5 Å resolutions, which is referred to as EM2NA. EM2NA is extensively evaluated on a diverse test set of 50 experimental maps at 2.0-5.0 Å resolutions, and compared with state-of-the-art methods including CryoREAD, ModelAngelo, and phenix.map_to_model. On average, EM2NA achieves a residue coverage of 83.15%, C4' RMSD of 1.06 Å, and sequence recall of 46.86%, which outperforms the existing methods. Moreover, EM2NA is applied to build the DNA/RNA structures with 10 to 5347 nt from an EMDB-wide data set of 263 unmodeled raw maps, demonstrating its ability in the blind model building of DNA/RNA from cryo-EM maps. EM2NA is fast and can normally build a DNA/RNA structure of <500 nt within 10 minutes.
Download full-text PDF |
Source |
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http://www.ncbi.nlm.nih.gov/pmc/articles/PMC11525807 | PMC |
http://dx.doi.org/10.1038/s41467-024-53721-4 | DOI Listing |
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