AI Article Synopsis

  • The study investigates distal stent graft-induced new entry (dSINE), a complication of the frozen elephant trunk (FET) procedure, and aims to understand its underlying mechanisms through simulation.
  • Using finite element analysis and computational fluid dynamics, it examines how different sizes of FET affect stress and blood flow in the aorta.
  • Findings indicate that both oversized and undersized FETs can contribute to dSINE through mechanisms like increased circumferential stress and wall shear stress, suggesting that simply choosing a smaller FET size may not prevent this complication.

Article Abstract

Objectives: Distal stent graft-induced new entry (dSINE), a new intimal tear at the distal edge of the frozen elephant trunk (FET), is a complication of FET. Preventive measures for dSINE have not yet been established. This study aimed to clarify the mechanisms underlying the development of dSINE by simulating the mechanical environment at the distal edge of the FET.

Methods: The stress field in the aortic wall after FET deployment was calculated using finite element analysis. Blood flow in the intraluminal space of the aorta and FET models was simulated using computational fluid dynamics. The simulations were conducted with various oversizing rates of FET ranging from 0 to 30% under the condition of FET with elastic recoil.

Results: The elastic recoil of the FET, which caused its distal edge to push against the greater curvature of the aorta, induced a concentration of circumferential stress and increased wall shear stress (WSS) at the aorta. Elastic recoil also created a discontinuous notch on the lesser curvature of the aorta, causing flow stagnation. An increase in the oversizing rate of the FET widened the large circumferential stress area on the greater curvature and increases the maximum stress. Conversely, a decrease in the oversizing rate of the FET increased the WSS and widened the area with high WSS.

Conclusions: Circumferential stress concentration due to an oversized FET and high WSS due to an undersized FET can cause a dSINE. The selection of smaller-sized FET alone might not prevent dSINE.

Download full-text PDF

Source
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC11568347PMC
http://dx.doi.org/10.1093/ejcts/ezae392DOI Listing

Publication Analysis

Top Keywords

distal edge
12
fet
12
circumferential stress
12
finite element
8
element analysis
8
computational fluid
8
fluid dynamics
8
distal stent
8
stent graft-induced
8
graft-induced entry
8

Similar Publications

Want AI Summaries of new PubMed Abstracts delivered to your In-box?

Enter search terms and have AI summaries delivered each week - change queries or unsubscribe any time!