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Faster and Safer "In situ" Synthesis of Germanane and Silicane. | LitMetric

Faster and Safer "In situ" Synthesis of Germanane and Silicane.

Small Methods

Department of Materials, Henry Royce Institute, National Graphene Institute, University of Manchester, Ox-ford Road, Manchester, M139PL, UK.

Published: October 2024

AI Article Synopsis

  • Germanane (GeH) and silicane (SiH) are promising 2D materials from the Xanes family with potential uses in electronics and energy storage due to their unique properties.
  • Traditional methods of synthesizing these materials typically involve dangerous acids like HCl and HF, which can be slow and pose safety risks.
  • A new synthesis method using hydrochloric acid combined with lithium fluoride generates HF in a safer and faster way, producing high-quality GeH and SiH with suitable bandgaps for semiconductor applications.

Article Abstract

Germanane (GeH) and silicane (SiH), members of the Xanes family, have garnered significant attention as 2D materials due to their diverse properties, which hold promise for applications in electronics, optoelectronics, energy storage, and sensing. Typically, highly concentrated hydrochloric acid (HCl) or hydrofluoric acid (HF) is employed in the synthesis of these Xanes, but both routes are problematic due to slow kinetics and safety concerns, respectively. Here for the first time, a faster and safer method is demonstrated for Xanes synthesis that harnesses the generation of HF "in situ" using a solution of HCl and lithium fluoride (LiF) salt, overcoming the key challenges of the conventional methods. A variety of characterization techniques to establish a baseline is utilized for both Xanes and to provide a holistic knowledge regarding this method, the possible consequences of this approach, and the possibility of applying it to other layered Zintl phases. The novel synthesis protocol results in high-quality GeH and SiH with bandgaps (E) of 1.75 and 2.47 eV respectively, highlighting their potential suitability for integration into semiconductor applications.

Download full-text PDF

Source
http://dx.doi.org/10.1002/smtd.202400964DOI Listing

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