AI Article Synopsis
- The work introduces a microwave sensor designed to measure three properties of solid samples: dielectric permittivity, loss tangent, and thickness, using a setup with three resonators sandwiching the sample.
- The interaction between the sample and resonators alters the sensor's electrical responses, which is analyzed to extract the desired properties.
- The proposed model was validated through 990 simulations and experimental tests with reference samples, demonstrating effective calibration and accurate multi-parameter sensing.
Article Abstract
This work presents a microwave resonant multi-parameter sensor devoted to the simultaneous extraction of three characteristics of a homogeneous solid sample: its dielectric permittivity, its loss tangent and its thickness. The device is composed of three coupled resonators in two different substrate boards, having the sample between the boards, in a sandwich configuration. Presence of the sample impacts the electrical response of the device, not only influencing resonators, but also by affecting inter-resonator couplings. A method to analyse the response of the device, allowing for the extraction of the desired characteristics of the sample is proposed, as well as an experimental calibration procedure. The model is built upon 990 simulations, calibrated with three reference-samples measurements and then tested over 18 experimental measurements, with good results, thereby validating the multi-parameter sensing approach.
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| http://www.ncbi.nlm.nih.gov/pmc/articles/PMC11452678 | PMC |
| http://dx.doi.org/10.1038/s41598-024-72061-3 | DOI Listing |
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