Peeling wheat yields higher-quality flour. During processing in a flaking machine, wheat kernels undergo continuous compression within the machine's chamber. As this compression persists, damage to the kernels intensifies and accumulates, eventually leading to kernel breakage. To study the damage characteristics of wheat kernels during peeling, this study established a continuous damage model based on Hertzian contact theory and continuous damage theory. The model's accuracy was validated through experiments, culminating in the calculation of critical parameters for wheat peeling. This study focused on different wheat varieties (Ningmai 22 and Jichun 1) and kernel sizes (the thicknesses of the small, medium, and large kernels were standardized as follows: Ningmai 22-2.67 ± 0.07 mm, 2.81 ± 0.07 mm, and 2.95 ± 0.07 mm; Jichun 1-2.98 ± 0.11 mm, 3.20 ± 0.11 mm, and 3.42 ± 0.11 mm). Continuous compression tests were conducted using a mass spectrometer, and critical damage parameters were analyzed and calculated by integrating the theoretical model with experimental data. The test results showed that the average maximum crushing force () for small, medium, and large-sized kernels of Ningmai 22 was 96.71 ± 2.27 N, 110.17 ± 2.68 N, and 128.41 ± 2.85 N, respectively. The average maximum crushing deformation (α) was 0.65 ± 0.08 mm, 0.68 ± 0.13 mm, and 0.77 ± 0.17 mm, respectively. The average elastic-plastic critical pressure () was 50.21 N, 60.13 N, and 59.08 N, respectively, and the average critical values of elastic-plastic deformation () were 0.37 mm, 0.38 mm, and 0.39 mm, respectively. For Jichun 1, the average maximum crushing force () for small-, medium-, and large-sized kernels was 113.34 ± 3.15 N, 125.28 ± 3.64 N, and 136.15 ± 3.29 N, respectively. The average maximum crushing deformation () was 0.75 ± 0.11 mm, 0.83 ± 0.15 mm, and 0.88 ± 0.18 mm, respectively. The average elastic-plastic critical pressure () was 58.11 N, 64.17 N, and 85.05 N, respectively, and the average critical values of elastic-plastic deformation () were 0.45 mm, 0.47 mm, and 0.52 mm, respectively. The test results indicated that during mechanical compression, if the deformation is less than , the continued application of the compression load will not result in kernel crushing. However, if the deformation exceeds , continued compression will lead to kernel crushing, with the required number of compressions decreasing as the deformation increases. If the deformation surpasses , a single compression load is sufficient to cause kernel crushing. Since smaller wheat kernels are more susceptible to breakage during processing, the peeling pressure () within the chamber should be controlled to remain below the average elastic-plastic critical pressure () of small-sized wheat kernels. Additionally, the kernel deformation () induced by the flow rate and loading in the chamber should be kept below the average elastic-plastic critical deformation () of small-sized wheat kernels. This paper provides a theoretical foundation for the structural design and optimization of processing parameters for wheat peeling machines.
Download full-text PDF |
Source |
---|---|
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC11431725 | PMC |
http://dx.doi.org/10.3390/foods13182981 | DOI Listing |
Front Plant Sci
December 2024
State Key Laboratory of Crop Gene Exploration and Utilization in Southwest China, Sichuan Agricultural University, Chengdu, China.
Wheat domestication and subsequent genetic improvement have yielded cultivated species with larger seeds compared to wild ancestors. Increasing thousand kernel weight (TKW) remains a crucial goal in many wheat breeding programs. To identify genomic regions influencing TKW across diverse genetic populations, we performed a comprehensive meta-analysis of quantitative trait loci (MQTL), integrating 993 initial QTL from 120 independent mapping studies over recent decades.
View Article and Find Full Text PDFFront Plant Sci
December 2024
State Key Laboratory of Crop Gene Exploration and Utilization in Southwest China, Ministry of Science and Technology, Chengdu, Sichuan, China.
Low solar irradiance reaching the canopy due to fog and heavy haze is a significant yield-limiting factor worldwide. However, how plants adapt to shade stress and the mechanisms underlying the reduction in leaf photosynthetic capacity and grain yield remain unclear. In this study (conducted during 2018-2021), we investigated the impact of light deprivation (60%) at the pre-anthesis and post-anthesis stages on leaf carboxylation efficiency, source-to-sink relationships, sucrose metabolism, and grain yield of wheat cultivars with contrasting shade tolerance.
View Article and Find Full Text PDFBackground: Wheat landraces represent a reservoir of genetic diversity that can support wheat improvement through breeding. A core panel of 300 Watkins wheat landraces, as well as 16 non-Watkins landraces and elite wheat cultivars, was grown during the 2020-2021 and 2021-2022 seasons at four Agricultural Research Stations in Egypt, Gemmiza, Nubaria, Sakha, and Sids, to evaluate the core panel for agromorphological and yield-related traits. The genetic population structure within these genotypes were assessed using 35,143 single nucleotide polymorphisms (SNPs).
View Article and Find Full Text PDFFront Plant Sci
November 2024
College of Agricultural Equipment Engineering, Henan University of Science and Technology, Luoyang, Henan, China.
Wheat, being a crucial global food crop, holds immense significance for food safety and agricultural economic stability, as the quality and condition of its grains are critical factors. Traditional methods of wheat grain detection are inefficient, and the advancements in deep learning offer a novel solution for fast and accurate grain recognition. This study proposes an improved deep learning model based on YOLOv8n, referred to as YOLO-SDL, aiming to achieve efficient wheat grain detection.
View Article and Find Full Text PDFPlant Biotechnol J
December 2024
State Key Laboratory for Crop Stress Resistance and High-Efficiency Production, College of Agronomy, Northwest A&F University, Yangling, Shaanxi, China.
Wheat stripe rust, caused by the fungal pathogen Puccinia striiformis f. sp. tritici (Pst), threatens global wheat production, and therefore discovering genes involved in stripe rust susceptibility is essential for balancing yield with disease resistance in sustainable breeding strategies.
View Article and Find Full Text PDFEnter search terms and have AI summaries delivered each week - change queries or unsubscribe any time!