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Oxygen Vacancy Compensation-Induced Analog Resistive Switching in the SrFeO/Nb:SrTiO Epitaxial Heterojunction for Noise-Tolerant High-Precision Image Recognition. | LitMetric

AI Article Synopsis

  • * The study investigates high-quality metal/oxide-semiconductor heterojunctions, focusing on the perovskite phase SrFeO (PV-SFO) and its interface with Nb-doped SrTiO (NSTO), overcoming challenges in creating effective interfaces and tailored contact barriers.
  • * Results show the PV-SFO memristor has excellent resistive properties, stable performance, and achieves up to 98.21% accuracy in handwriting recognition tasks and 92.21% for color images, showcasing its potential for applications in

Article Abstract

Neuromorphic computing, inspired by the brain's architecture, promises to surpass the limitations of von Neumann computing. In this paradigm, synaptic devices play a crucial role, with resistive switching memory (memristors) emerging as promising candidates due to their low power consumption and scalability advantages. This study focuses on the development of metal/oxide-semiconductor heterojunctions, which offer several technological advantages and have broad potential for applications in artificial neural synapses. However, constructing high-quality epitaxial interfaces between metal and oxide semiconductors and designing modifiable contact barriers are challenging. Herein, we construct high-quality epitaxial metal/semiconductor interfaces based on the metallicity of the perovskite phase SrFeO (PV-SFO) and a small Schottky barrier in contact with Nb-doped SrTiO (NSTO). X-ray diffraction patterns, reciprocal space mapping results, and cross-sectional transmission electron microscopy images reveal that the prepared PV-SFO film exhibits a perfect single-crystal structure and an excellent epitaxial interface with the NSTO (111) substrate. The corresponding memristor exhibits analog-type resistive-variable characteristics with an ON/OFF ratio of ∼1000, stable data retention after 10,000 s, and no noticeable fluctuation in resistance after 10,000 pulse cycles. Electron energy loss spectroscopy, first-principles calculations, and electrical measurements reveal that compensating or restoring oxygen vacancies at the NSTO surface decreases or increases the contact barrier between PV-SFO and NSTO, respectively, thereby gradually regulating the resistance value. Furthermore, high-quality epitaxial PV-SFO/NSTO devices achieve up to 98.21% recognition accuracy for handwriting recognition tasks using LeNet-5-based network structures and 92.21% accuracy for color images using visual geometry group (VGG) network structures. This work contributes to the advancement of interface-type memristors and provides valuable insights into enhancing synaptic functionality in neuromorphic computing systems.

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Source
http://dx.doi.org/10.1021/acsami.4c07951DOI Listing

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