Severity: Warning
Message: file_get_contents(https://...@pubfacts.com&api_key=b8daa3ad693db53b1410957c26c9a51b4908&a=1): Failed to open stream: HTTP request failed! HTTP/1.1 429 Too Many Requests
Filename: helpers/my_audit_helper.php
Line Number: 176
Backtrace:
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 176
Function: file_get_contents
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 250
Function: simplexml_load_file_from_url
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 3122
Function: getPubMedXML
File: /var/www/html/application/controllers/Detail.php
Line: 575
Function: pubMedSearch_Global
File: /var/www/html/application/controllers/Detail.php
Line: 489
Function: pubMedGetRelatedKeyword
File: /var/www/html/index.php
Line: 316
Function: require_once
Indium seals have been used extensively in ultra-high vacuum and cryogenic applications. Typically, these seals use indium alongside or in place of other metal gaskets in stainless-steel vacuum flanges, with some custom applications for flanges sealing directly with glass (optics or tubes). Here, we present the design and performance of three pressed indium seals (99.99% In) between aluminum and 0.5 in. diameter sapphire optics and aluminum and gold coated Kovar semiconductor packages (TO-66 and TO-39). Test fixtures were designed to mimic those of future tunable diode laser spectrometers for Earth, planetary, and manned spaceflight environmental monitoring applications. Successful high-hermeticity seals [<10-10 atm cc/s (He)] were achieved for all seals formed with sufficient pressure applied to allow indium to flow between mating surfaces. The hermeticity of the seals was maintained after temperature cycling (-10 to +80 °C, 20 cycles), with the optical seals surviving extended duration tests (-55 to +85 °C, per MIL-STD-883). Semiconductor packages (TO-39) subjected to these extended tests saw a moderate increase in leak rate [∼5 × 10-9 atm cc/s (He)]; however, further testing showed that either the glass-metal package seals or the indium were affected (the sample size was too small to draw firm conclusions for future applications). Overall, these results suggest long-term survivability of indium seals for Kovar-aluminum and sapphire-aluminum interfaces [>10 years at 10-10 atm cc/s (He)], where the coefficient of thermal expansion differs by approximately four times.
Download full-text PDF |
Source |
---|---|
http://dx.doi.org/10.1063/5.0206815 | DOI Listing |
Enter search terms and have AI summaries delivered each week - change queries or unsubscribe any time!