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Interpretable Structural Evaluation of Metal-Oxide Nanostructures in Scanning Transmission Electron Microscopy (STEM) Images via Persistent Homology. | LitMetric

AI Article Synopsis

  • Persistent homology helps analyze complex structures, and this study emphasizes making its results interpretable by examining geometric features in persistent diagrams (PDs) from STEM images of Pt-CeO nanostructures.
  • The researchers focused on specific PD quadrants to extract five key features related to the nanostructures' patterns and used hierarchical clustering and PCA to analyze the PDs.
  • They discovered that the number of small arc-like structures in the PDs indicated the disorder level in the nanostructures, enabling the classification of 12 different Pt-CeO nanostructures based on their features.

Article Abstract

Persistent homology is a powerful tool for quantifying various structures, but it is equally crucial to maintain its interpretability. In this study, we extracted interpretable geometric features from the persistent diagrams (PDs) of scanning transmission electron microscopy (STEM) images of self-assembled Pt-CeO nanostructures synthesized under different annealing conditions. We focused on PD quadrants and extracted five interpretable features from the zeroth and first PDs of nanostructures ranging from maze-like to striped patterns. A combination of hierarchical clustering and inverse analysis of PDs reconstructed by principal component analysis through vectorization of the PDs highlighted the importance of the number of arc-like structures of the CeO phase in the first PDs, particularly those that were smaller than a characteristic size. This descriptor enabled us to quantify the degree of disorder, namely the density of bends, in nanostructures formed under different conditions. By using this descriptor along with the width of the CeO phase, we classified 12 Pt-CeO nanostructures in an interpretable way.

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Source
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC11397156PMC
http://dx.doi.org/10.3390/nano14171413DOI Listing

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