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A working memory dependent dual process model of the testing effect. | LitMetric

A working memory dependent dual process model of the testing effect.

NPJ Sci Learn

Department of Psychology, The Chinese University of Hong Kong, Shatin, Hong Kong.

Published: September 2024

AI Article Synopsis

  • The article builds on a dual-process model related to working memory to explain how people experience the testing effect differently.
  • It identifies two main processes involved in the testing effect: attempting to retrieve information and re-encoding that information after retrieval.
  • The authors suggest further research to explore the balance between the benefits of testing and the demands it places on working memory, aiming to improve personalized education strategies.

Article Abstract

This Perspective article expands on a working memory-dependent dual-process model, originally proposed by Zheng et al., to elucidate individual differences in the testing effect. This model posits that the testing effect comprises two processes: retrieval-attempt and post-retrieval re-encoding. We substantiate this model with empirical evidence and propose future research. This model invites further studies on the trade-off between testing benefits and WM demands, facilitating the development of personalized educational practices.

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Source
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC11385580PMC
http://dx.doi.org/10.1038/s41539-024-00268-0DOI Listing

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