New type of filaments for improved accuracy of multiple sulfur isotope analyses by electron-impact gas-source mass spectrometry.

Rapid Commun Mass Spectrom

Earth System Science Interdisciplinary Center and Department of Geology, University of Maryland, College Park, MD, USA.

Published: November 2024

Rationale: The analysis of the three sulfur stable isotope ratios (S/S, S/S, S/S) is routinely performed by gas-source isotope ratio mass spectrometry (IRMS) on the SF gaseous molecule, collecting SF ions at m/z ~ 127, 128, 129 and 131. High precision and accuracy are commonly achieved owing to a lack of correction because fluorine has only one isotope and the inert nature of the SF molecule. The analysis of the S/S ratio is, however, complicated by the low abundance of S (~0.015%) and the possible occurrence of trace amounts of fluorocarbon compounds leading to CF ions at m/z ~ 131, i.e. where SF ions are collected.

Methods: We used gas-source high-resolution IRMS to better characterize the nature of possible interferences, and we tested novel types of filaments in order to investigate their influence on possible interferences.

Results: We confirm that the CF ion represents the main isobaric interference at m/z ~ 131. We also demonstrate that tungsten fluoride adducts are formed from the reaction of fluorine ions derived during fragmentation of the SF molecule with the hot tungsten filament. These reactions lead to the formation of e.g. WF , WF , WF ions, including doubly charged ions. WF , in particular, leads to isobaric interference on m/z ~ 128, 129 and 131 from WF , WF and WF ions, respectively. Because W (0.12%) is at low abundance, its influence on δS measurements would remain negligible, but W (26.5%) and W (28.4%) lead to scale contraction for both δS and δS.

Conclusions: Rather than correcting for these interferences, or working at high mass resolution, we suggest avoiding W isobaric interferences by using other types of filaments, with initial reports on both pure Re filaments and YO-coated W filaments.

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Source
http://dx.doi.org/10.1002/rcm.9873DOI Listing

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