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Statistical and machine learning models for location-specific crop yield prediction using weather indices. | LitMetric

Crop yield prediction gains growing importance for all stakeholders in agriculture. Since the growth and development of crops are fully connected with many weather factors, it is inevitable to incorporate meteorological information into yield prediction mechanism. The changes in climate-yield relationship are more pronounced at a local level than across relatively large regions. Hence, district or sub-region-level modeling may be an appropriate approach. To obtain a location- and crop-specific model, different models with different functional forms have to be explored. This systematic review aims to discuss research papers related to statistical and machine-learning models commonly used to predict crop yield using weather factors. It was found that Artificial Neural Network (ANN) and Multiple Linear Regression were the most applied models. Support Vector Regression (SVR) model has a high success ratio as it performed well in most of the cases. The optimization options in ANN and SVR models allow us to tune models to specific patterns of association between weather conditions of a location and crop yield. ANN model can be trained using different activation functions with optimized learning rate and number of hidden layer neurons. Similarly, the SVR model can be trained with different kernel functions and various combinations of hyperparameters. Penalized regression models namely, LASSO and Elastic Net are better alternatives to simple linear regression. The nonlinear machine learning models namely, SVR and ANN were found to perform better in most of the cases which indicates there exists a nonlinear complex association between crop yield and weather factors.

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http://dx.doi.org/10.1007/s00484-024-02763-wDOI Listing

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