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Fast and Artifact-Free Excitation Multiplexing Using Synchronized Image Scanning. | LitMetric

AI Article Synopsis

  • Multicolor fluorescence microscopy is crucial for studying structures in life and materials sciences, but capturing multiple labels at once can lead to measurement errors due to different excitation spectra.
  • The authors propose a new method that synchronizes the movement of the sample image on the sensor with different light wavelengths, allowing for nearly simultaneous imaging while minimizing errors.
  • Their technique effectively reveals hidden states in quantum dots and improves imaging of calcium signaling in neurons, demonstrating its practical applications in research.

Article Abstract

Multicolor fluorescence microscopy is an essential tool to visualize structures and dynamics in the life and materials sciences. However, the near-simultaneous acquisition of labels differing in excitation spectrum is difficult and renders such measurements prone to artifacts. We present a simple strategy to provide quasi-simultaneous fluorescence imaging with multiple excitation wavelengths by using an optical element to displace the sample image on the sensor at a rate that is much faster than the image acquisition rate and synchronizing this with the illumination. The emission elicited by the different wavelengths can then be encoded into the point-spread function of the imaging or visualized as multiple distinct images. In doing so, our approach can eliminate or mitigate artifacts caused by temporal aliasing in conventional sequential imaging. We demonstrate the use of our system to uncover hidden emissive states in single quantum dots and for the imaging of Ca signaling in neurons.

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Source
http://dx.doi.org/10.1021/acs.nanolett.4c00258DOI Listing

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