The inherent ambiguity in reconstructed images from coherent diffraction imaging (CDI) poses an intrinsic challenge, as images derived from the same dataset under varying initial conditions often display inconsistencies. This study introduces a method that employs the Noise2Noise approach combined with neural networks to effectively mitigate these ambiguities. We applied this methodology to hundreds of ambiguous reconstructed images retrieved from a single diffraction pattern using a conventional retrieval algorithm. Our results demonstrate that ambiguous features in these reconstructions are effectively treated as inter-reconstruction noise and are significantly reduced. The post-Noise2Noise treated images closely approximate the average and singular value decomposition analysis of various reconstructions, providing consistent and reliable reconstructions.
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http://dx.doi.org/10.1107/S1600577524006519 | DOI Listing |
J Xray Sci Technol
December 2024
Henan Key Laboratory of Imaging and Intelligent Processing, Information Engineering University, Zhengzhou, Henan, China.
Background: Coherent diffraction imaging (CDI) is an important lens-free imaging method. As a variant of CDI, ptychography enables the imaging of objects with arbitrary lateral sizes. However, traditional phase retrieval methods are time-consuming for ptychographic imaging of large-size objects, e.
View Article and Find Full Text PDFJ Synchrotron Radiat
January 2025
ESRF - The European Synchrotron, 71 Avenue des Martyrs, 38000 Grenoble, France.
Coherent diffractive imaging experiments often collect incomplete datasets containing regions that lack any measurements. These regions can arise because of beamstops, gaps between detectors, or, in tomography experiments, a missing wedge of data due to a limited sample rotation range. We describe practical and effective approaches to mitigate reconstruction artifacts by bringing uniqueness back to the phase retrieval problem.
View Article and Find Full Text PDFJ Synchrotron Radiat
January 2025
Department of Engineering and System Science, National Tsing Hua University, Hsinchu 30013, Taiwan.
Coherent diffraction microscopy (CDM) is a robust direct imaging method due to its unique 2D/3D phase retrieval capacity. Nonetheless, its resolution faces limitations due to a diminished signal-to-noise ratio (SNR) in high-frequency regions. Addressing this challenge, X-ray ensemble diffraction microscopy (XEDM) emerges as a viable solution, ensuring an adequate SNR in high-frequency regions and effectively surmounting resolution constraints.
View Article and Find Full Text PDFPhys Rev E
November 2024
Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, California 90095, USA.
We demonstrate that in situ coherent diffractive imaging (CDI), which leverages the coherent interference between strong and weak beams to illuminate static and dynamic structures, can serve as a highly dose-efficient imaging method. At low doses, in situ CDI can achieve higher resolution than perfect lenses with the point spread function as a delta function. Both our numerical simulations and experimental results demonstrate that combining in situ CDI with ptychography can reduce the required dose by up to two orders of magnitude compared with ptychography alone.
View Article and Find Full Text PDFDiscov Nano
December 2024
Department of Physics and Astronomy, University of Southampton, Southampton, SO17 1BJ, UK.
Multiferroic materials that exhibit interacting and coexisting properties, like ferroelectricity and ferromagnetism, possess significant potential in the development of novel technologies that can be controlled through the application of external fields. They also exhibit varying regions of polarity, known as domains, with the interfaces that separate the domains referred to as domain walls. In this study, using three-dimensional (3D) bragg coherent diffractive imaging (BCDI), we investigate the dynamics of multiferroic domain walls in a single hexagonal dysprosium manganite (h-DyMnO ) nanocrystal under varying applied electric field.
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