AI Article Synopsis
- The paper introduces a fine dust detection system that utilizes surface acoustic wave (SAW) sensors, which change their resonance points when exposed to fine dust.
- The system includes two channels—a sensing channel and a reference channel—each equipped with a SAW oscillator and a 20-bit asynchronous counter to measure frequency differences.
- The proposed circuit demonstrates a high frequency resolution of 0.95 parts per million (ppm) while operating at 460 MHz and was fabricated using a TSMC 130 nm CMOS process.
Article Abstract
This paper proposed a fine dust detection system using time-interleaved counters in which surface acoustic wave (SAW) sensors changed the resonance point characteristic. When fine dust was applied to the SAW sensor, the resonance point decreased. The SAW oscillator made of the SAW sensor and radio frequency (RF) amplifier generated an oscillation frequency that was the same as the resonance frequency. The oscillation frequency was transferred to digital data by a 20-bit asynchronous counter. This system has two channels: a sensing channel and a reference channel. Each channel has a SAW oscillator and a 20-bit asynchronous counter. The difference of the two channel counter results is the frequency difference. Through this, it is possible to know whether fine dust adheres to the SAW sensor. The proposed circuit achieved 0.95 ppm frequency resolution when it was operated at a frequency of 460 MHz. This circuit was implemented in a TSMC 130 nm CMOS process.
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Source |
|---|---|
| http://www.ncbi.nlm.nih.gov/pmc/articles/PMC11244120 | PMC |
| http://dx.doi.org/10.3390/s24134149 | DOI Listing |
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