AI Article Synopsis
- - The main goal of forensic investigation is to find and examine evidence, and microscopy plays a key role in analyzing that evidence for case resolution.
- - Scanning probe microscopes, especially the atomic force microscope (AFM), are essential tools in forensic analysis, providing detailed insights into the structure and properties of evidence without damaging it.
- - The article highlights the use of AFM in nanomechanical forensics and its effectiveness in characterizing samples that are important for forensic investigations.
Article Abstract
The primary objective of forensic investigation of a case is to recognize, identify, locate, and examine the evidence. Microscopy is a technique that provides crucial information for resolving a case or advancing the investigation process by analyzing the evidence obtained from a crime scene. It is often used in conjunction with suitable analytical techniques. Various microscopes are employed; scanning probe microscopes are available in diverse forensic analyses and studies. Among these, the atomic force microscope (AFM) is the most commonly used scanning probe technology, offering a unique morphological and physico-chemical perspective for analyzing multiple pieces of evidence in forensic investigations. Notably, it is a non-destructive technique capable of operating in liquid or air without complex sample preparation. The article delves into a detailed exploration of the applications of AFM in the realms of nanomechanical forensics and nanoscale characterization of forensically significant samples.
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| http://dx.doi.org/10.1016/j.jflm.2024.102717 | DOI Listing |
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