ultra-small-angle and wide-angle X-ray scattering enables simultaneous tracking of the structural parameters of mesoporous CeO from the atomic scale to the micron-size scale. This multiscale approach provides a path to better understand structure-property relationships in mesoporous polycrystalline materials under dynamic conditions such as high temperature cycling.
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| http://dx.doi.org/10.1039/d4cc02128b | DOI Listing |
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