AI Article Synopsis
- PEDOT:PSS films are being explored as a transparent electrode alternative to indium-tin oxide, thanks to their better transparency, flexibility, and stability, although their low conductivities present a challenge.
- The study shows that treating PEDOT:PSS films with HSO solutions significantly boosts their electrical conductivity from 0.5 S/cm to 4358 S/cm, indicating enhanced performance.
- Raman imaging reveals microstructural changes in the films after treatment, with a shift in C═C stretching modes suggesting improved crystallinity and conformation, providing a useful method for assessing the structural properties of conductive films.
Article Abstract
Poly(3,4-ethylenedioxythiophene):poly(styrene sulfonate) (PEDOT:PSS) films have emerged as potential alternatives to indium-tin oxide as transparent electrodes in optoelectronic devices because of their superior transparency, flexibility, and chemical doping stability. However, pristine PEDOT:PSS films show low conductivities because the insulating PSS-rich domains isolate the conductive PEDOT-rich domains. In this study, the conductivities and corresponding spatially resolved Raman properties of PEDOT:PSS thin films treated with various concentrations of HSO are presented. After the PEDOT:PSS films are treated with the HSO solutions, their electrical conductivities are significantly improved from 0.5 (nontreated) to 4358 S cm (100% v/v). Raman heat maps of the peak shifts and widths of the C═C stretching mode are constructed. A blueshift and width decrease of the C═C Raman mode in PEDOT are uniformly observed in the entire measurement area (20 × 20 µm), indicating that microstructural transitions are successfully accomplished across the area from the coiled to linear conformation and high crystallinity upon HSO treatment. Thus, it is proved that comprehensive Raman map analysis can be easily utilized to clarify microstructural properties distributed in large areas induced by various dopants. These results also offer valuable insights for evaluating and optimizing the performance of other conductive thin films.
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| http://dx.doi.org/10.1002/marc.202400299 | DOI Listing |
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