Severity: Warning
Message: file_get_contents(https://...@gmail.com&api_key=61f08fa0b96a73de8c900d749fcb997acc09&a=1): Failed to open stream: HTTP request failed! HTTP/1.1 429 Too Many Requests
Filename: helpers/my_audit_helper.php
Line Number: 176
Backtrace:
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 176
Function: file_get_contents
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 250
Function: simplexml_load_file_from_url
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 3122
Function: getPubMedXML
File: /var/www/html/application/controllers/Detail.php
Line: 575
Function: pubMedSearch_Global
File: /var/www/html/application/controllers/Detail.php
Line: 489
Function: pubMedGetRelatedKeyword
File: /var/www/html/index.php
Line: 316
Function: require_once
Fundamental equations describing the X-ray and electron diffraction scattering in imperfect crystals have been derived in the form of the matrix Fredholm-Volterra integral equation of the second kind. A theoretical approach has been developed using the perfect-crystal Green function formalism. In contrast, another approach utilizes the wavefield eigenfunctions related to the diagonalized matrix propagators of the conventional Takagi-Taupin and Howie-Whelan equations. Using the Liouville-Neumann-type series formalism for building up the matrix Fredholm-Volterra integral equation solutions, the general resolvent function solutions of the X-ray and electron diffraction boundary-valued Cauchy problems have been obtained. Based on the resolvent-type solutions, the aim is to reveal the features of the diffraction scattering onto the crystal lattice defects, including the mechanisms of intra- and interbranch wave scattering in the strongly deformed regions in the vicinity of crystal lattice defect cores. Using the two-stage resolvent solution of the second order, this approach has been supported by straightforward calculation of the electron bright- and dark-field contrasts of an edge dislocation in a thick foil. The results obtained for the bright- and dark-field profiles of the edge dislocation are discussed and compared with analogous ones numerically calculated by Howie & Whelan [Proc. R. Soc. A (1962), 267, 206].
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http://dx.doi.org/10.1107/S2053273324002730 | DOI Listing |
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