Dielectric probing of low-temperature degradation resistance of commercial zirconia bio-ceramics.

Dent Mater

School of Engineering and Materials Science, Queen Mary University of London, Mile End Road, London E1 4NS, UK. Electronic address:

Published: June 2024

Objectives: To investigate the effect of the stability of oxygen vacancies on the low-temperature degradation (LTD) resistance of two kinds of commercial zirconia-based materials (3Y-TZP ceramics and Ce-TZP/AlO composites) via the dielectric probing methods.

Methods: The commercial 3Y-TZP ceramics and Ce-TZP/AlO composites were prepared via conventional solid-state methods. Density, phase content, microstructure, strain, and biaxial flexural strength (BFS) of two materials were investigated using Archimedes method, XRD, SEM, strain-electric field (S-E) loops and ball-on-ring methods, respectively. The concentration of oxygen vacancies before and after LTD of two materials were evaluated using dielectric probing and XPS methods.

Results: The XRD analysis revealed that compared to the 3Y-TZP ceramics, the Ce-TZP/AlO composites showed better LTD resistance, without clear LTD. The greater LTD resistance for Ce-TZP/AlO composites was associated with their stability of oxygen vacancies, by higher activation energy based on the dielectric measurements and XPS results. For the 3Y-TZP ceramics that underwent the tetragonal to the monoclinic phase transition during the LTD treatment, the concentration of their oxygen vacancies decreased after LTD. In addition, the Ce-TZP/AlO composites exhibited higher flexural strength and potential fracture toughness based on the BFS testing and strain vs electric field measurement results, indicating a great potential for use in fixed restorative dental applications.

Significance: This work suggested the stability of oxygen vacancies played a key role in the resistance to LTD. Optimizing the stability of the oxygen vacancies is key to the development of more reliable zirconia- based dental biomaterials with greater resistance to LTD.

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http://dx.doi.org/10.1016/j.dental.2024.04.008DOI Listing

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