AI Article Synopsis
- High energy resolution fluorescence detected X-ray absorption spectroscopy is an effective technique for investigating the electronic properties of functional materials, especially in operando conditions.
- The method allows for real-time studies in environments like electrochemical cells, making it useful for understanding materials in practical applications.
- The study specifically examines a BiVO photoanode, revealing small changes in spectral lines due to applied potential, which are linked to the occupation of electronic states near the material's band edges.
Article Abstract
High energy resolution fluorescence detected X-ray absorption spectroscopy is a powerful method for probing the electronic structure of functional materials. The X-ray penetration depth and photon-in/photon-out nature of the method allow operando experiments to be performed, in particular in electrochemical cells. Here, operando high-resolution X-ray absorption measurements of a BiVO photoanode are reported, simultaneously probing the local electronic states of both cations. Small but significant variations of the spectral lineshapes induced by the applied potential were observed and an explanation in terms of the occupation of electronic states at or near the band edges is proposed.
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Source |
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| http://www.ncbi.nlm.nih.gov/pmc/articles/PMC11075712 | PMC |
| http://dx.doi.org/10.1107/S1600577524002741 | DOI Listing |
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