AI Article Synopsis

  • InGaAs detection systems are essential in aerospace applications, needing precise evaluation methods due to high signal-to-noise ratio demands for infrared payloads.
  • The study introduces a neural network-based approach to predict the scattering parameters of rigid-flex printed circuit boards (PCBs), which significantly affect weak infrared signals.
  • Utilizing simulated samples, the neural network model demonstrated over 99% accuracy in predictions, improving design efficiency and quality for InGaAs detection circuits.

Article Abstract

InGaAs detection systems have been increasingly used in the aerospace field, and due to the high signal-to-noise ratio requirements of short-wave infrared quantitative payloads, there is an urgent need for methods for the rapid and precise evaluation and the optimal design of these systems. The rigid-flex printed circuit board (PCB) is a vital component of InGaAs detectors, as its grid ground plane design parameters impact parasitic capacitance and thus affect weak infrared analog signals. To address the time-intensive and costly nature of design optimization achieved with simulations and experimental measurements, we propose an innovative method based on a neural network to predict the scattering parameters of rigid-flex boards for InGaAs detection links. This is the first study in which the effects of rigid-flex boards on weak infrared detection signals have been considered. We first obtained sufficient samples with software simulation. A backpropagation (BP) neural network prediction model was trained on existing sample sets and then verified on a rigid-flex board used in a crucial aerospace short-wave infrared quantitative mission. The model efficiently and accurately predicted high-speed interconnect scattering parameters under various rigid-flex board grid plane parameter conditions. The prediction error was less than 1% compared with a 3D field solver, indicating an overcoming of the iterative optimization inefficiency and showing improved design quality for InGaAs detection circuits.

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Source
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC11014035PMC
http://dx.doi.org/10.3390/s24072221DOI Listing

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