AI Article Synopsis
- This work introduces an open-source software package that simulates X-ray reflectivity (XRR) and helps reconstruct film structures from measured XRR curves.
- The software features a user-friendly interface for interactive simulation and uses a recursive method based on Fresnel equations, with tools for modeling multilayer structures.
- The latest version includes enhancements like automatic fitting for XRR curves using an improved optimization algorithm and a new single-window interface for a better user experience.
Article Abstract
This work introduces (), an open-source software package designed to simulate X-ray reflectivity (XRR) and address the inverse problem of reconstructing film structures on the basis of measured XRR curves. features a user-friendly graphical interface that facilitates interactive simulation and reconstruction. The software employs a recursive approach based on the Fresnel equations to calculate XRR and incorporates specialized tools for modeling periodic multilayer structures. This article presents the latest version of the software (), with notable improvements. These enhancements encompass an automatic fitting capability for XRR curves utilizing a modified flight particle swarm optimization algorithm. A novel cost function was also developed specifically for fitting XRR curves of periodic structures. Furthermore, the overall user experience has been enhanced by developing a new single-window interface.
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| http://www.ncbi.nlm.nih.gov/pmc/articles/PMC11001402 | PMC |
| http://dx.doi.org/10.1107/S1600576724001031 | DOI Listing |
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