Integrated approach for simultaneously measuring thermophysical parameters of semi-transparent materials.

To concurrently determine the thermophysical parameters of semi-transparent materials, a novel, to the best of our knowledge, integrated approach for concurrent measurement is proposed. In the measurement setup, a high-temperature radiation source and a beam reducer are employed to minimize the influence of background radiation. In order to differentiate between the transmitted and emitted radiation in the detection signal, the radiation signals from the radiation source are measured under four different conditions, enabling the calculation of transmissivity, emissivity, and reflectivity. The reliability and accuracy of the measurement method are validated by the thermophysical parameters of sapphire, and the results demonstrate a strong agreement between the measured data and previous findings. The combined uncertainties of transmissivity and emissivity for the sapphire at 753 K are estimated, highlighting the novel contribution of this method in investigating the thermophysical parameters of semi-transparent materials.