Herein, nanocomposites made of Ni nanoparticles distributed in an amorphous silicon nitride (Ni/a-SiN) matrix, on the one hand, and within an amorphous silicon dioxide (Ni/a-SiO) matrix, on the other hand, were synthesized from the same Ni-modified polysilazane precursor. In both compounds, the Ni/Si atomic ratio (0.06-0.07), average Ni nanocrystallite size (7.0-7.6 nm) and micro/mesoporosity of the matrix were rigorously fixed. Hydrogen (H)-temperature-programmed desorption (TPD) profile analysis revealed that the activation energy for H desorption at about 100-130 °C evaluated for the Ni/a-SiN sample (47.4 kJ mol) was lower than that for the Ni/a-SiO sample (68.0 kJ mol). Mechanistic study with X-ray photoelectron spectroscopy (XPS) analysis and density functional theory (DFT) calculations revealed that, at Ni nanoparticle/matrix heterointerfaces, Ni becomes more covalently bonded to N atoms in the a-SiN matrix compared to O atoms in the a-SiO matrix. Therefore, based on experimental and theoretical studies, we elucidated that nickel-nitrogen (Ni-N) interactions at the heterointerface lead to remarkable Ni d band broadening and downshifting of the d band center relative to those generated by Ni-oxygen (Ni-O) interactions at the heterointerface. This facilitates H desorption, as experimentally observed in the Ni/a-SiN sample.

Download full-text PDF

Source
http://dx.doi.org/10.1039/d3dt04155gDOI Listing

Publication Analysis

Top Keywords

amorphous silicon
12
band center
8
silicon nitride
8
matrix hand
8
ni/a-sin sample
8
interactions heterointerface
8
matrix
6
downshift band
4
center nanoparticles
4
nanoparticles confined
4

Similar Publications

Interface Modification by GaO Atomic Layers within Er-Doped GeO Nanofilms for Enhanced Electroluminescence and Operation Stability.

ACS Appl Mater Interfaces

January 2025

School of Materials Science and Engineering, Tianjin Key Lab for Rare Earth Materials and Applications, Nankai University, Tianjin 300350, China.

For silicon-based devices using dielectric oxides doped with rare earth ions, their electroluminescence (EL) performance relies on the sufficient carrier injection. In this work, the atomic GaO layers are inserted within the Er-doped GeO nanofilms fabricated by atomic layer deposition (ALD). Both Ga(CH) and Ga(CH) could realize the ALD growth of GaO onto the as-deposited GeO nanofilm with unaffected deposition rates.

View Article and Find Full Text PDF

Indium (In) reduction is a hot topic in transparent conductive oxide (TCO) research. So far, most strategies have been focused on reducing the layer thickness of In-based TCO films and exploring TCOs. However, no promising industrial solution has been obtained yet.

View Article and Find Full Text PDF

Development of a high-performance pseudocapacitive composite via electroless deposition of silver nanoparticles on micro-sized silicon.

Sci Rep

December 2024

Department of Theoretical Electrical Engineering and Diagnostics of Electrical Equipment, Institute of Electrodynamics, National Academy of Sciences of Ukraine, Beresteyskiy, 56, Kyiv-57, 03680, Ukraine.

An energy material has been developed using a one-step chemical reduction method, incorporating silver nanoparticles (AgNPs) that encapsulate micro-sized silicon (mSi) flakes. SEM investigation revealed complete encapsulation of silicon flakes by AgNP's dendritic structure, EDX confirmed the deposition of Ag on Si flakes. Raman spectroscopy confirmed the formation of silver and silicon oxides.

View Article and Find Full Text PDF

Bacterial infections are a common cause of clinical complications associated with the use of orthodontic microimplants. Biofilm formation on their surfaces and subsequent infection of peri-implant tissues can result in either exfoliation or surgical removal of these medical devices. In order to improve the properties of microimplants, hybrid coatings enriched with silver nanoparticles, calcium, and phosphorus were investigated.

View Article and Find Full Text PDF

With reduced dimensionality and a high surface area-to-volume ratio, two-dimensional (2D) semiconductors exhibit intriguing electronic properties that are exceptionally sensitive to surrounding environments, including directly interfacing gate dielectrics. These influences are tightly correlated to their inherent behavior, making it critical to examine when extrinsic charge carriers are intentionally introduced to the channel for complementary functionality. This study explores the physical origin of the competitive transition between intrinsic and extrinsic charge carrier conduction in extrinsically -doped MoS, highlighting the central role of interactions of the channel with amorphous gate dielectrics.

View Article and Find Full Text PDF

Want AI Summaries of new PubMed Abstracts delivered to your In-box?

Enter search terms and have AI summaries delivered each week - change queries or unsubscribe any time!