J Phys Chem Lett
Institute of Physics of the Czech Academy of Sciences, Cukrovarnicka 10, 16200 Prague, Czech Republic.
Published: February 2024
Photothermal deflection spectroscopy (PDS) emerges as a highly sensitive noncontact technique for measuring absorption spectra and serves for studying defect states within semiconductor thin films. In our study, we applied PDS to methylammonium lead bromide single crystals. By analyzing the frequency dependence of the PDS spectra and the phase difference of the signal, we can differentiate between surface and bulk deep defect absorption states. This methodology allowed us to investigate the effects of bismuth doping and light-induced degradation. The identified absorption states are attributed to MA vibrational states and structural defects, and their influence on the nonradiative recombination probability is discussed. This distinction significantly enhances our capability to characterize and analyze perovskite materials at a deeper level.
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http://dx.doi.org/10.1021/acs.jpclett.3c02966 | DOI Listing |
Nanomaterials (Basel)
January 2025
FZU-Institute of Physics of the Czech Academy of Sciences, Na Slovance 1999/2, 182 00 Prague, Czech Republic.
The in situ combination of plasma-enhanced chemical vapor deposition (PECVD) and vacuum evaporation in the same vacuum chamber allowed us to integrate germanium nanocrystals (Ge NCs) into hydrogenated amorphous silicon carbide (a-SiC:H) thin films deposited from monomethyl silane diluted with hydrogen. Transmission electron microscopy (TEM) and energy-dispersive X-ray (EDX) spectroscopy were used for the microscopic characterization, while photothermal deflection spectroscopy (PDS) and near-infrared photoluminescence spectroscopy (NIR PL) were for optical characterization. The presence of Ge NCs embedded in the amorphous a-Si:C:H thin films was confirmed by TEM and EDX.
View Article and Find Full Text PDFProc Natl Acad Sci U S A
January 2025
Faculty of Technical Chemistry, Institute of Chemical Technologies and Analytics, Technische Universität Wien, Vienna 1060, Austria.
Atomic force microscopy-infrared spectroscopy (AFM-IR) is a photothermal scanning probe technique that combines nanoscale spatial resolution with the chemical analysis capability of mid-infrared spectroscopy. Using this hybrid technique, chemical identification down to the single molecule level has been demonstrated. However, the mechanism at the heart of AFM-IR, the transduction of local photothermal heating to cantilever deflection, is still not fully understood.
View Article and Find Full Text PDFInt J Biol Macromol
December 2024
Laboratory for Environmental and Life Sciences, University of Nova Gorica, Vipavska 13, Nova Gorica SI-5000, Slovenia.
In this work, photothermal beam deflection spectrometric technique (BDS) is applied for non-contact and non-destructive characterization of chitosan (CS): cellulose (CEL) biocomposites with incorporated sporopollenin exine capsules (SEC). The objective was to determine the structural and thermal properties of synthesized CS:CEL:SEC composites with varying amounts of SEC, and to validate the BDS by photopyroelectric calorimetry (PPE) as an independent technique. It was found that CS:CEL biocomposites without SEC exhibit low porosities, which are on the order of 0.
View Article and Find Full Text PDFInorg Chem
August 2024
Department of Chemistry and Biochemistry and Biomolecular Sciences Institute, Florida International University, Miami, Florida 33199, United States.
Dimethoxynitrophenyl-EDTA (DMNP) is a popular calcium cage that is frequently used to investigate the role of Ca in signaling processes . Lanthanides have been used in Ca biomimetics due to similarities in coordination properties of Ln and Ca that may enable fluorescence and NMR studies of functional and structural properties of Ca binding proteins. In this study, we show that Tb, Eu, and Nd bind strongly to DMNP in a 1:1 ratio.
View Article and Find Full Text PDFJ Phys Chem Lett
February 2024
Institute of Physics of the Czech Academy of Sciences, Cukrovarnicka 10, 16200 Prague, Czech Republic.
Photothermal deflection spectroscopy (PDS) emerges as a highly sensitive noncontact technique for measuring absorption spectra and serves for studying defect states within semiconductor thin films. In our study, we applied PDS to methylammonium lead bromide single crystals. By analyzing the frequency dependence of the PDS spectra and the phase difference of the signal, we can differentiate between surface and bulk deep defect absorption states.
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