Determination of the refractive-index change in the excited state based on transient absorption microscopy.

Photoinduced excited-state carriers can affect both the absorption coefficient and refractive index of materials and influence the performance of photoelectric devices. Femtosecond time-resolved pump-probe transient absorption (TA) spectroscopy is usually used to detect carrier dynamics and excited-state absorption coefficients; however, measurements of transient refractive-index change are still difficult. We propose a method for determining the excited-state refractive-index change using TA microscopy. In TA measurements, a Fabry-Pérot cavity formed by the front and back surfaces of the sample could lead to interference of the probe light. As the wavelength of standing waves in the Fabry-Pérot cavity is closely related to the refractive index, the carrier-induced excited-state refractive-index change was obtained by comparing the transmission probe spectra between the ground and excited states. The proposed method was used to study the dynamics of excited-state refractive-index change in a perovskite film.