Titanium thin films are particularly important as electrode layers, barrier layers, or intermediate buffer layers in the semiconductor industry. In order to improve the quality of Ti thin films and the adhesion and diffraction abilities of irregular parts, this paper used high-power pulsed magnetron sputtering (HPPMS/HiPIMS) to prepare titanium thin films. The effects of different trigger voltages (700 V, 800 V, and 900 V) on plasma properties were studied, and the microstructure, mechanical properties and corrosion resistance of the films were also studied. The results showed that as the voltage increased, the grain size of the thin films gradually increased. The residual stress of the titanium films changed from compressive stress (-333 MPa) to tensile stress (55 MPa) and then to low compressive stress (-178 MPa). The hardness values were 13 GPa, 9.45 GPa and 6.62 GPa, respectively. The wear resistance of the films gradually decreased, while the toughness gradually increased. The corrosion resistance of the films decreased as well.

Download full-text PDF

Source
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC10707676PMC
http://dx.doi.org/10.3390/ma16237294DOI Listing

Publication Analysis

Top Keywords

thin films
16
resistance films
12
films
9
titanium films
8
pulsed magnetron
8
magnetron sputtering
8
titanium thin
8
corrosion resistance
8
films gradually
8
gradually increased
8

Similar Publications

Want AI Summaries of new PubMed Abstracts delivered to your In-box?

Enter search terms and have AI summaries delivered each week - change queries or unsubscribe any time!