Modeling of Charge Injection, Recombination, and Diffusion in Complete Perovskite Solar Cells on Short Time Scales.

Materials (Basel)

Institute of Physics, Faculty of Physics, Adam Mickiewicz University in Poznan, Uniwersytetu Poznańskiego 2, 61-614 Poznan, Poland.

Published: November 2023

AI Article Synopsis

  • A model is presented to analyze how charge populations decay in perovskite solar cells when excited by ultrafast optical pulses, taking into account various processes such as charge injection, diffusion, and recombination.
  • The equation derived from this model is solved through numerical simulations, which align well with experimental data obtained from transient absorption measurements of a specific perovskite material.
  • The study suggests optimal methods for measuring and modeling charge transfer dynamics in these solar cells, highlighting the importance of analyzing both electron and hole transport layers under varying conditions.

Article Abstract

A model of charge population decay upon ultrafast optical pulse excitation in complete, working perovskite solar cells is proposed. The equation, including charge injections (extractions) from perovskite to contact materials, charge diffusion, and charge recombination via first-, second-, and third-order processes, is solved using numerical simulations. Results of simulations are positively verified by broadband transient absorption results of mixed halide, triple-cation perovskite (FAMACsPb(IBr)). The combined analytical and experimental findings reveal the best approaches for the proper determination of the crucial parameters that govern charge transfer dynamics in perovskite solar cells on picosecond and single nanosecond time scales. Measurements from both electron and hole transporting layer sides under different applied bias potentials (zero and close to open circuit potential) and different pump fluence (especially below 5 μJ/cm), followed by fitting of parameters using numerical modeling, are proposed as the optimal methodology for describing the processes taking place in efficient devices.

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Source
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC10672245PMC
http://dx.doi.org/10.3390/ma16227110DOI Listing

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