We study the interface representation of the contact process at its directed-percolation critical point, where the scaling properties of the interface can be related to those of the original particle model. Interestingly, such a behavior happens to be intrinsically anomalous and more complex than that described by the standard Family-Vicsek dynamic scaling Ansatz of surface kinetic roughening. We expand on a previous numerical study by Dickman and Muñoz [Phys. Rev. E 62, 7632 (2000)10.1103/PhysRevE.62.7632] to fully characterize the kinetic roughening universality class for interface dimensions d=1,2, and 3. Beyond obtaining scaling exponent values, we characterize the interface fluctuations via their probability density function (PDF) and covariance, seen to display universal properties which are qualitatively similar to those recently assessed for the Kardar-Parisi-Zhang (KPZ) and other important universality classes of kinetic roughening. Quantitatively, while for d=1 the interface covariance seems to be well described by the KPZ, Airy_{1} covariance, no such agreement occurs in terms of the fluctuation PDF or the scaling exponents.
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http://dx.doi.org/10.1103/PhysRevE.108.044801 | DOI Listing |
J Chem Phys
December 2024
Engineering Research Center of Advanced Functional Material Manufacturing of Ministry of Education, School of Chemical Engineering, Zhengzhou University, Zhengzhou 450001, China.
Modification of copper-based catalysts by incorporating a second metal is prevailing in developing high-performance catalysts for CO2 hydrogenation. In particular, the insight into how the reaction is influenced is key to understanding the nature of the strategy. Herein, we show that both intermediates and reaction pathways of CO2 over Cu(100) are conspicuously regulated by Ni deposition and CO2 pressure.
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November 2024
Research Institute for Applied Mechanics, Kyushu University, 6-1 Kasuga-koen, Kasuga, Fukuoka, 816-8580, Japan.
Kinetic roughening of the (001) singular surface during steady crystal growth is studied on the basis of a lattice model using the Monte Carlo method. At a sufficiently low temperature, there are known to be two kinetic roughening points as the driving force for crystal growth increases. At a low driving force , there is the Karder-Parisi-Zhang (KPZ) roughening transition point.
View Article and Find Full Text PDFAnalyst
November 2024
Institute for Research in Molecular Medicine, (INFORMM), Universiti Sains Malaysia (USM), 11800, Gelugor, Penang, Malaysia.
Sulfuric acid is commonly used to electrochemically activate gold electrodes in a variety of electrochemical applications. This work provides the first evaluations of the electrochemical behaviors and a 3D image of an activated screen-printed gold electrode (SPGE, purchased commercially) through electrochemical and imaging analyses. The activated SPGE surface appears rougher than the unactivated SPGE surface when viewed through microtopography images using scanning electron microscopy (SEM) and atomic force microscopy (AFM).
View Article and Find Full Text PDFInt J Implant Dent
July 2024
Weintraub Center for Reconstructive Biotechnology, UCLA School of Dentistry, 10833 Le Conte Avenue B3-087, Box951668, Los Angeles, CA, 90095-1668, USA.
Considering the biological activity of osteoblasts is crucial when devising new approaches to enhance the osseointegration of implant surfaces, as their behavior profoundly influences clinical outcomes. An established inverse correlation exists between osteoblast proliferation and their functional differentiation, which constrains the rapid generation of a significant amount of bone. Examining the surface morphology of implants reveals that roughened titanium surfaces facilitate rapid but thin bone formation, whereas smooth, machined surfaces promote greater volumes of bone formation albeit at a slower pace.
View Article and Find Full Text PDFPolymers (Basel)
May 2024
Department of Physics, Research Institute of Physics and Chemistry, Jeonbuk National University, Jeonju 54896, Republic of Korea.
The kinetic roughening of polymer films grown by vapor deposition polymerization was analyzed using the widely accepted classification framework of "generic scaling ansatz" given for the structure factor. Over the past two decades, this method has played a pivotal role in classifying diverse forms of dynamic scaling and understanding the mechanisms driving interface roughening. The roughness exponents of the polymer films were consistently determined as α=1.
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